Combined scanning transmission electron microscopy tilt- and focal series

Microscopy and Microanalysis

Volumn 20, Issue 2, 2014, Pages 548-560

  Dahmen, Tim ^a   Baudoin, Jean Pierre ^b,f   Lupini, Andrew R ^c   Kübel, Christian ^d   Slusallek, Philipp ^a   De Jonge, Niels ^b,e  

^a GERMAN RESEARCH CENTER FOR ARTIFICIAL INTELLIGENCE DFKI   (Germany)

^b VANDERBILT UNIVERSITY SCHOOL OF MEDICINE   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^e INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

^f TIMONE HOSPITAL   (France)

Author keywords

3D; 3D reconstruction; back projection; focal series; nanoparticle; SART; STEM; tomography; whole cell

Indexed keywords

NANOPARTICLE;

ALGORITHM; ARTIFACT; COMPARATIVE STUDY; ELECTRON TOMOGRAPHY; EVALUATION STUDY; MACROPHAGE; PROCEDURES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THEORETICAL MODEL; THREE DIMENSIONAL IMAGING; ULTRASTRUCTURE;

ALGORITHMS; ARTIFACTS; ELECTRON MICROSCOPE TOMOGRAPHY; IMAGING, THREE-DIMENSIONAL; MACROPHAGES; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; MODELS, THEORETICAL; NANOPARTICLES;

EID: 84899478454     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927614000075     Document Type: Article

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