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Volumn 2, Issue 19, 2014, Pages 3762-3768

Intrinsic low dielectric behaviour of a highly thermally stable Sr-based metal-organic framework for interlayer dielectric materials

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; CRYSTALLOGRAPHY; D REGION; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

EID: 84899082993     PISSN: 20507534     EISSN: 20507526     Source Type: Journal    
DOI: 10.1039/c4tc00149d     Document Type: Article
Times cited : (70)

References (57)
  • 3
    • 84899121436 scopus 로고    scopus 로고
    • The International Technology Roadmap for Semiconductors (ITRS), 2011 Edition
    • The International Technology Roadmap for Semiconductors (ITRS), 2011 Edition
  • 47
    • 84876900403 scopus 로고    scopus 로고
    • 2 = 0.0557 [all data], GOF = 1.026. CCDC = (1) contains the ESI crystallographic data for this paper
    • A. D. Aljaberi J. T. S. Irvine J. Mater. Chem. A 2013 1 5868
    • (2013) J. Mater. Chem. A , vol.1 , pp. 5868
    • Aljaberi, A.D.1    Irvine, J.T.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.