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Volumn , Issue , 2013, Pages 217-222

Enabling a manufacturable 3D technologies and ecosystem using 28nm FPGA with stack silicon interconnect technology

Author keywords

Interposer; Manufacturing yield; Micro joining; Stacked silicon interconnect technology; Warpage

Indexed keywords

ECOSYSTEMS; ELECTRONICS PACKAGING; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); JOINING; MICROELECTRONICS;

EID: 84897386129     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (23)

References (9)
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  • 3
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  • 5
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    • Oct.
    • H. P. R. Frederikse, R. J. Fields, and A. Feldman, "Thermal and electricalproperties of copper-tin and nickel-tin intermetallics," J. Appl. Phys., Vol. 72, no. 7, Pages 2879-2882 (Oct. 1992)
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    • Frederikse, H.P.R.1    Fields, R.J.2    Feldman, A.3
  • 7
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    • Effect of cu content on the mechanical reliability of Ni/Sn-3.5Ag system
    • Kim, J. Y. et al, "Effect of Cu Content on the Mechanical Reliability of Ni/Sn-3.5Ag System," Journal of Materials Research, Volume. 22, No. 3, Pages 770-776 (2007)
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  • 8
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    • Effect of 0.5wt% cu in sn-3.5%AgSolder on the interfacial reaction with Au/Ni metallization
    • Alam, M. O. et al, "Effect of 0.5wt% Cu in Sn-3.5%AgSolder on the Interfacial Reaction with Au/Ni Metallization," Chem. Mater., Vol. 15, No. 23, Pages 4340-4342 (2003)
    • (2003) Chem. Mater. , vol.15 , Issue.23 , pp. 4340-4342
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  • 9
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    • Impurity and alloying effects on interfacial reaction layers in pb-free soldering
    • 31 March
    • T. Laurila, V. Vuorinen, M. Paulasto-Krockel, "Impurity and alloying effects on interfacial reaction layers in Pb-free soldering," Materials Science and Engineering R, Volume 68, Issues 1-2, 31, Pages 1-38 (March 2010)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.