Stoichiometry-driven metal-to-insulator transition in NdTiO 3/SrTiO3 heterostructures

Applied Physics Letters

Volumn 104, Issue 8, 2014, Pages

  Xu, Peng ^a   Phelan, Daniel ^a   Seok Jeong, Jong ^a   Andre Mkhoyan, K ^a   Jalan, Bharat ^a  

^a University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ELECTRIC RESISTANCE MEASUREMENT; FERMI LIQUIDS; FILM GROWTH; METAL INSULATOR TRANSITION; MOLECULAR BEAM EPITAXY; NEODYMIUM COMPOUNDS; POSITIVE IONS; SHEET METAL; STOICHIOMETRY; SUBSTRATES; THIN FILMS;

CATION STOICHIOMETRY; ELECTRONIC TRANSPORT PROPERTIES; METAL-TO-INSULATOR TRANSITIONS; METALLIC BEHAVIORS; SHEET RESISTANCE MEASUREMENTS; TEMPERATURE DEPENDENT; TRANSPORT BEHAVIOR; WIDE TEMPERATURE RANGES;

TITANIUM COMPOUNDS;

EID: 84896759115     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4866867     Document Type: Article

References (33)

1. M. Imada, A. Fujimori, and Y. Tokura, Rev. Mod. Phys. 70, 1039 (1998). 10.1103/RevModPhys.70.1039
2. J. B. Goodenough, Localized to Itinerant Electronic Transition in Perovskites Oxides, in Structure and Bonding (Springer-Verlag, New York, 1998).
3. M. Nakamura, A. Sawa, H. Sato, H. Akoh, M. Kawasaki, and Y. Tokura, Phys. Rev. B 75, 155103 (2007). 10.1103/PhysRevB.75.155103
4. C. H. Ahn, J. M. Triscone, and J. Mannhart, Nature 424, 1015 (2003). 10.1038/nature01878
5. S. Yunoki, A. Moreo, E. Dagotto, S. Okamoto, S. S. Kancharla, and A. Fujimori, Phys. Rev. B 76, 064532 (2007). 10.1103/PhysRevB.76.064532
6. R. Scherwitzl, P. Zubko, I. G. Lezama, S. Ono, A. F. Morpurgo, G. Catalan, and J. M. Triscone, Adv. Mater. 22, 5517 (2010). 10.1002/adma.201003241
7. T. A. Cain, P. Moetakef, C. A. Jackson, and S. Stemmer, Appl. Phys. Lett. 101, 111604 (2012). 10.1063/1.4752439
8. M. Hosoda, C. Bell, Y. Hikita, and H. Y. Hwang, Appl. Phys. Lett. 102, 091601 (2013). 10.1063/1.4794410
9. J. Son, B. Jalan, A. P. Kajdos, L. Balents, S. J. Allen, and S. Stemmer, Appl. Phys. Lett. 99, 192107 (2011). 10.1063/1.3659310
10. H. W. Jang, D. A. Felker, C. W. Bark, Y. Wang, M. K. Niranjan, C. T. Nelson, Y. Zhang, D. Su, C. M. Folkman, S. H. Baek, S. Lee, K. Janicka, Y. Zhu, X. Q. Pan, D. D. Fong, E. Y. Tsymbal, M. S. Rzchowski, and C. B. Eom, Science 331, 886 (2011). 10.1126/science.1198781
11. T. Higuchi, Y. Hotta, T. Susaki, A. Fujimori, and H. Y. Hwang, Phys. Rev. B 79, 075415 (2009). 10.1103/PhysRevB.79.075415
12. B. A. Gray, E. J. Moon, I. C. Tung, M. Kareev, J. Liu, D. J. Meyers, M. J. Bedzyk, J. W. Freeland, and J. Chakhalian, "Enhanced spin and electronic reconstructions at the cuprate-manganite interface," preprint arXiv:1301.3736v1 [cond-mat.str-el] (2013).
13. Z. Wang, M. Okude, M. Saito, S. Tsukimoto, A. Ohtomo, M. Tsukada, M. Kawasaki, and Y. Ikuhara, Nat. Commun. 1, 106 (2010). 10.1038/ncomms1111
14. L. Qiao, T. C. Droubay, T. Varga, M. E. Bowden, V. Shutthanandan, Z. Zhu, T. C. Kaspar, and S. A. Chambers, Phys. Rev. B 83, 085408 (2011). 10.1103/PhysRevB.83.085408
15. H. K. Sato, C. Bell, Y. Hikita, and H. Y. Hwang, Appl. Phys. Lett. 102, 251602 (2013). 10.1063/1.4812353
16. M. P. Warusawithana, C. Richter, J. A. Mundy, P. Roy, J. Ludwig, S. Paetel, T. Heeg, A. A. Pawlicki, L. F. Kourkoutis, M. Zheng, M. Lee, B. Mulcahy, W. Zander, Y. Zhu, J. Schubert, J. N. Eckstein, D. A. Muller, C. S. Hellberg, J. Mannhart, and D. G. Schlom, Nat. Commun. 4, 2351 (2013). 10.1038/ncomms3351
17. A. S. Sefat, J. E. Greedan, G. M. Luke, and M. Niewczas, Phys. Rev. B 74, 104419 (2006). 10.1103/PhysRevB.74.104419
18. A. C. Komarek, H. Roth, M. Cwik, W. D. Stein, J. Baier, M. Kriener, F. Bouree, T. Lorenz, and M. Braden, Phys. Rev. B 75, 224402 (2007). 10.1103/PhysRevB.75.224402
19. B. Steele, A. D. Burns, A. Chernatynskiy, R. W. Grimes, and S. R. Phillpot, J. Mater. Sci. 45, 168 (2010). 10.1007/s10853-009-3912-y
20. L. King, K. Y. Hsieh, D. J. Lichtenwalner, and A. I. Kingon, Appl. Phys. Lett. 59, 3045 (1991). 10.1063/1.105788
21. K. Endo, S. Saya, S. Misawa, and S. Yoshida, Thin Solid Films 206, 143 (1991). 10.1016/0040-6090(91)90409-Q
22. T. Wang, K. Ganguly, P. Marshal, P. Xu, and B. Jalan, Appl. Phys. Lett. 103, 212904 (2013). 10.1063/1.4833248
23. See supplementary material at http://dx.doi.org/10.1063/1.4866867 E-APPLAB-104-012409 for further information about the film resistivity, surface morphology and stoichiometry-dependent out-of-plane lattice parameter, electron concentration, and mobility.
24. C. M. Brooks, L. F. Kourkoutis, T. Heeg, J. Schubert, D. A. Muller, and D. G. Schlom, Appl. Phys. Lett. 94, 162905 (2009). 10.1063/1.3117365
25. B. Jalan, R. Engel-Herbert, N. J. Wright, and S. Stemmer, J. Vac. Sci. Technol. A 27, 461 (2009). 10.1116/1.3106610
26. T. Ohnishi, K. Shibuya, T. Yamamoto, and M. Lippmaa, J. Appl. Phys. 103, 103703 (2008). 10.1063/1.2921972
27. E. Breckenfeld, A. B. Shah, and L. W. Martin, J. Mater. Chem. C 1, 8052 (2013). 10.1039/c3tc31653j
28. P. Moetakef, J. Y. Zhang, S. Raghavan, A. P. Kajdos, and S. Stemmer, J. Vac. Sci. Technol. A 31, 041503 (2013). 10.1116/1.4804180
29. D. L. Proffit, H. W. Jang, S. Lee, C. T. Nelson, X. Q. Pan, M. S. Rzchowski, and C. B. Eom, Appl. Phys. Lett. 93, 111912 (2008). 10.1063/1.2979237
30. P. B. Chakraborty, K. Byczuk, and D. Vollhardt, Phys. Rev. B 84, 035121 (2011). 10.1103/PhysRevB.84.035121
31. P. Moetakef, T. A. Cain, D. G. Ouellette, J. Y. Zhang, D. O. Klenov, A. Janotti, C. G. Van de Walle, S. Rajan, S. J. Allen, and S. Stemmer, Appl. Phys. Lett. 99, 232116 (2011). 10.1063/1.3669402
32. J. Biscaras, N. Bergeal, A. Kushwaha, T. Wolf, A. Rastogi, R. C. Budhani, and J. Lesueur, Nat. Commun. 1, 89 (2010). 10.1038/ncomms1084
33. P. Moetakef, J. Y. Zhang, A. Kozhanov, B. Jalan, R. Seshadri, S. J. Allen, and S. Stemmer, Appl. Phys. Lett. 98, 112110 (2011). 10.1063/1.3568894