Independent analysis of mechanical data from atomic force microscopy

Measurement Science and Technology

Volumn 25, Issue 4, 2014, Pages

  Klapetek, P ^a,b   Necas D ^c  

^a CZECH METROLOGY INSTITUTE   (Czech Republic)

^b BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

^c MASARYK UNIVERSITY   (Czech Republic)

Author keywords

atomic force microscopy; mechanical properties; volume data

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURVE FITTING; MECHANICAL PROPERTIES; SCANNING PROBE MICROSCOPY; UNCERTAINTY ANALYSIS;

FORCE-DISTANCE CURVES; INDEPENDENT ANALYSIS; LARGE DATA VOLUMES; MECHANICAL PROPERTIES MAPPINGS; NUMERICAL PROCESSING; SPECTROSCOPIC MEASUREMENTS; TECHNICAL IMPLEMENTATION; VOLUME DATA;

DATA HANDLING;

EID: 84896749782     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/25/4/044009     Document Type: Article

References (23)

1. Butt H J, Capella B and Kappl M 2005 Force measurements with the atomic force microscope: technique, interpretation and applications Surf. Sci. Rep. 59 1-152
2. Sikora A and Bednarz L 2011 Direct measurement and control of peak tapping forces in atomic force microscopy for improved height measurements Meas. Sci. Technol. 22 094005
3. www.bruker.com (Bruker PeakForceQNM application notes) - ref-separator
4. Kajiyama T, Tanaka K, Ge S R and Takahara A 1996 Morphology and mechanical properties of polymer surfaces via scanning force microscopy Prog. Surf. Sci. 52 1-52
5. Reneker D H and Magonov S N 1997 Characterization of polymer surfaces with atomic force microscopy Annu. Rev. Mater. Sci. 27 175-222
6. Schön P, Bagdi K, Molnár K, Markus P and Pukánszky B 2011 Quantitative mapping of elastic moduli at the nanoscale in phase separated polyurethanes by AFM Eur. Polym. J. 47 692-8
7. Adamcik J, Berquand A and Mezzenga R 2011 Single-step direct measurement of amyloid fibrils stiffness by peak force quantitative nanomechanical atomic force microscopy Appl. Phys. Lett. 98 193701
8. Mostowy S, Janel S, Forestier C, Roduit C, Kasas S, Pizarro-Cerdá J, Cossart P and Lafont F 2011 A role for septins in the interaction between the Listeria monocytogenes invasion protein InlB and the Met receptor Biophys. J. 100 1949-59
9. Nečas D and Klapetek P 2012 Gwyddion: an open-source software for SPM data analysis Cent. Eur. J. Phys. 10 181-8
10. http://punias.voila.net/ - ref-separator -
11. Kim M S, Choi J H, Kim J H and Park Y K 2007 SI-traceable determination of spring constants of various atomic force microscope cantilevers with a small uncertainty of 1% Meas. Sci. Technol. 18 3351-8
12. Cumpson P J, Clifford C A and Hedley J 2004 Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration Meas. Sci. Technol. 15 1337-46
13. Clifford C A and Seah M P 2005 The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis Nanotechnology 16 1666-80
14. Cleveland J P 1993 A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy Rev. Sci. Instrum. 64 403
15. Sader J E 1995 Parallel beam approximation for v-shaped atomic force microscope cantilevers Rev. Sci. Instrum. 66 4583
16. Campbellová A, Valtr M, Zůda J and Klapetek P 2011 Traceable measurements of small forces and local mechanical properties Meas. Sci. Technol. 22 094007
17. Hutter J L 2005 Comment on 'Tilt of atomic force microscope cantilevers: effect on spring constant and adhesion measurements' Langmuir 21 2630-2
18. Carpick R W, Ogletree D F and Salmeron M 1999 A General equation for fitting contact area and friction versus load measurements J. Colloid Interface Sci. 211 395-400
19. Attard P 2000 Interaction and deformation of elastic bodies: origin of adhesion hysteresis J. Phys. Chem. B 104 10635-41
20. Zanette S I, Caride A O, Nunes V B, Klimchitskaya G L, Freire F L and Prioli R 2000 Theoretical and experimental investigation of the force-distance relation for an atomic force microscope with a pyramidal tip Surf. Sci. 453 75-82
21. Klapetek P, Nečas D, Campbellová A, Yacoot A and Koenders L 2011 Methods for determining and processing 3D errors and uncertainties for AFM data analysis Meas. Sci. Technol. 22 025501
22. ISO guide 98-3/Suppl. 1:2008
23. Villarubia J S 1997 Algorithms for scanned probe microscope image simulation, surface reconstruction and tip estimation J. Res. Natl Inst. Stand. Technol. 102 425