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Volumn , Issue , 2013, Pages 39-44

Performance characterization of TAS-MRAM architectures in presence of capacitive defects

Author keywords

Capacitive defects; Fault modeling; Non volaitte memories; Spintronics; TAS MRAM; Test

Indexed keywords


EID: 84894851469     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (10)
  • 6
    • 0036735641 scopus 로고    scopus 로고
    • Noise generation and coupling mechanisms in deep-submicron LCS
    • Sept.-Oct
    • X. Aragones, J.L. Gonzalez, F. Moll, and A. Rubio, "Noise Generation and Coupling Mechanisms in Deep-Submicron lCs," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 27-35, Sept.-Oct. 2002.
    • (2002) IEEE Design & Test of Computers , vol.19 , Issue.5 , pp. 27-35
    • Aragones, X.1    Gonzalez, J.L.2    Moll, F.3    Rubio, A.4
  • 8
    • 73849144542 scopus 로고    scopus 로고
    • Dynamic compact model of thermally assisted switching magnetic tunnel junctions
    • M. El Baraji et at, "Dynamic Compact Model of Thermally Assisted Switching Magnetic Tunnel Junctions," Journal of Applied Physics, vol. 106, no 12,2009.
    • (2009) Journal of Applied Physics , vol.106 , Issue.12
    • El Baraji, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.