-
2
-
-
39749200848
-
Testing MRAM for write disturbance fault
-
C.L. Su, C.W. Tsai, C.W. Wu, C.C. Hung, Y.S. Chen, and M.J. Kao, "Testing MRAM for Write Disturbance Fault," in Proc. of IEEE International Test Conference, pp. 277-288,2006.
-
(2006)
Proc. of IEEE International Test Conference
, pp. 277-288
-
-
Su, C.L.1
Tsai, C.W.2
Wu, C.W.3
Hung, C.C.4
Chen, Y.S.5
Kao, M.J.6
-
3
-
-
18144400442
-
MRAM defect analysis and fault modeling
-
C.L. Su, R.F. Huang, and C.W. Wu, "MRAM Defect Analysis and Fault Modeling," in Proc. of IEEE International Test Conference, pp. 124-133,2004.
-
(2004)
Proc. of IEEE International Test Conference
, pp. 124-133
-
-
Su, C.L.1
Huang, R.F.2
Wu, C.W.3
-
4
-
-
84862082597
-
Impact of resistive-open defects on the heat current of tas-mram architectures
-
J, Azevcdo, A. Virazel, A. Bosto, L. Dilillo, P. Girard, A. Todri, G. Prenat, J. Alvarez-Herault, and K, Mackay, "Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM Architectures," in Proc. of Design Automation and Test in Europe, pp. 532-537, 2012.
-
(2012)
Proc. of Design Automation and Test in Europe
, pp. 532-537
-
-
Azevcdo, J.1
Virazel, A.2
Bosto, A.3
Dilillo, L.4
Girard, P.5
Todri, A.6
Prenat, G.7
Alvarez-Herault, J.8
Mackay, K.9
-
5
-
-
84872524154
-
Impact of resistive-bridge defects in TAS-MRAM architectures
-
J. Azevedo, A. Virazel. A. Bosio, L. Dilillo, P. Girard, A. Todri, G. Prenat, J. Alvarez-Herault, and K, Mackay, "Impact of Resistive-Bridge Defects in TAS-MRAM Architectures." in Proc. of IEEE Asian Test Symposium, 2012.
-
(2012)
Proc. of IEEE Asian Test Symposium
-
-
Azevedo, J.1
Virazel. Bosio A, A.2
Dilillo, L.3
Girard, P.4
Todri, A.5
Prenat, G.6
Alvarez-Herault, J.7
Mackay, K.8
-
6
-
-
0036735641
-
Noise generation and coupling mechanisms in deep-submicron LCS
-
Sept.-Oct
-
X. Aragones, J.L. Gonzalez, F. Moll, and A. Rubio, "Noise Generation and Coupling Mechanisms in Deep-Submicron lCs," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 27-35, Sept.-Oct. 2002.
-
(2002)
IEEE Design & Test of Computers
, vol.19
, Issue.5
, pp. 27-35
-
-
Aragones, X.1
Gonzalez, J.L.2
Moll, F.3
Rubio, A.4
-
8
-
-
73849144542
-
Dynamic compact model of thermally assisted switching magnetic tunnel junctions
-
M. El Baraji et at, "Dynamic Compact Model of Thermally Assisted Switching Magnetic Tunnel Junctions," Journal of Applied Physics, vol. 106, no 12,2009.
-
(2009)
Journal of Applied Physics
, vol.106
, Issue.12
-
-
El Baraji, M.1
|