Incremental diagnosis and correction of multiple faults and errors

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 716-721

  Veneris, Andreas ^a   Liu, J Brandon ^a   Amiri, Mandana ^a   Abadir, Magdy S ^b  

^a UNIVERSITY OF TORONTO   (Canada)

^b MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN ERRORS; EXPONENTIAL COMPLEXITY; LOGIC DEBUGGING; MULTIPLE FAULTS; STUCK-AT FAULTS;

ERRORS; EXHIBITIONS; ITERATIVE METHODS;

DESIGN;

EID: 84893778198     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998378     Document Type: Conference Paper

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