Nanorobotic in situ characterization of nanowire memristors and 'memsensing'

IEEE International Conference on Intelligent Robots and Systems

Volumn , Issue , 2013, Pages 1028-1033

  Fan, Zheng ^a   Fan, Xudong ^b   Li, Alex ^c   Dong, Lixin ^a  

^a Michigan State University   (United States)

^b MICHIGAN STATE UNIVERSITY   (United States)

^c AIR FORCE INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

in situ nanotechnology; memristor; memsensor; nanorobotic manipulation

Indexed keywords

ELECTRON-BEAM IRRADIATIONS; EXPERIMENTAL INVESTIGATIONS; HYSTERESIS CHARACTERISTICS; IN-SITU CHARACTERIZATION; MEMRISTOR; MEMSENSOR; NANO-ROBOTIC MANIPULATION; OXYGEN VACANCY MIGRATION;

ELECTRON ENERGY LOSS SPECTROSCOPY; INTELLIGENT ROBOTS; NANOELECTRONICS; NANOROBOTICS; NANOSENSORS; NANOWIRES; OXYGEN VACANCIES; PASSIVE FILTERS; TRANSMISSION ELECTRON MICROSCOPY;

MEMRISTORS;

EID: 84893776945     PISSN: 21530858     EISSN: 21530866     Source Type: Conference Proceeding    
DOI: 10.1109/IROS.2013.6696477     Document Type: Conference Paper

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