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Volumn , Issue , 2003, Pages 317-320
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A gate leakage reduction strategy for future CMOS circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYSIS OF MECHANISMS;
CMOS CIRCUITS;
GATE LEAKAGE REDUCTION;
GATE LEAKAGES;
INPUT PATTERNS;
SUB-THRESHOLD LEAKAGE;
TUNNELLING CURRENT;
TWO-INPUT NAND GATES;
CMOS INTEGRATED CIRCUITS;
LEAKAGE CURRENTS;
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EID: 84893773446
PISSN: 19308833
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ESSCIRC.2003.1257136 Document Type: Conference Paper |
Times cited : (20)
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References (7)
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