Residual stress in CIGS thin film solar cells on polyimide: Simulation and experiments

Journal of Materials Science: Materials in Electronics

Volumn 25, Issue 1, 2014, Pages 461-465

  Lin, Yi Cheng ^a   Peng, Xiang Yu ^a   Wang, Li Ching ^b   Lin, Yao Leng ^a   Wu, Cheng Han ^b   Liang, Shih Chang ^b  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CIGS ABSORBER LAYERS; CIGS THIN FILMS; COMPRESSIVE RESIDUAL STRESS; EMPIRICAL FORMULAS; POLYIMIDE SUBSTRATE; SPUTTERING TECHNIQUES; THICKNESS RATIO; THIN FILM SOLAR CELLS;

FILM THICKNESS; GALLIUM ALLOYS; POLYIMIDES; SEMICONDUCTING SELENIUM COMPOUNDS; SOLAR CELLS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

RESIDUAL STRESSES;

EID: 84893692370     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-013-1610-7     Document Type: Article

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