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Volumn 520, Issue 1, 2011, Pages 404-412

Interface stress induced hardness enhancement and superelasticity in polytetrafluoroethylene/metal multilayer thin films

Author keywords

Hardness enhancement; Multilayer thin films; Nanoindentation; Polytetrafluoroethylene; Sputtering; Superelasticity

Indexed keywords

ALUMINOSILICATE GLASS; ANOMALOUS BEHAVIOR; DC MAGNETRON SPUTTERING; FILM HARDNESS; HARDNESS ENHANCEMENT; INTERFACE ENERGY; INTERFACE STRESS; INTERNAL STRESS; INVESTIGATE EFFECTS; LOW SURFACE ENERGY; METAL FILM; METAL LAYER; MINIMUM VALUE; MODULATION PERIOD; MULTI-LAYER THIN FILM; MULTILAYER THIN FILMS; MULTILAYERING; NANO-INDENTATION MEASUREMENTS; NANOINDENTATION ANALYSIS; PTFE/AL; RF-MAGNETRON SPUTTERING; SUPERELASTICITY;

EID: 80054038342     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.07.034     Document Type: Article
Times cited : (14)

References (40)
  • 14
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    • (2001) Data Sheet of Surface Tension of Polymers
  • 17
    • 0003802209 scopus 로고    scopus 로고
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  • 21
    • 80054011992 scopus 로고    scopus 로고
    • ICDD (International Centre for Diffraction Data) Card, Card Number 04-0787 Aluminum.
    • ICDD (International Centre for Diffraction Data) Card, Card Number 04-0787 Aluminum.
  • 22
    • 80054029216 scopus 로고    scopus 로고
    • ICDD (International Centre for Diffraction Data) Card, Card Number 04-0836 Copper.
    • ICDD (International Centre for Diffraction Data) Card, Card Number 04-0836 Copper.
  • 23
    • 80054030737 scopus 로고    scopus 로고
    • ICDD (International Centre for Diffraction Data) Card, Card Number 05-0682 Titanium.
    • ICDD (International Centre for Diffraction Data) Card, Card Number 05-0682 Titanium.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.