Capturing wetting states in nanopatterned silicon

ACS Nano

Volumn 8, Issue 1, 2014, Pages 885-893

  Xu, Xiumei ^a   Vereecke, Guy ^a   Chen, Chang ^a,b   Pourtois, Geoffrey ^a,c   Armini, Silvia ^a   Verellen, Niels ^a,b   Tsai, Wei Kang ^d   Kim, Dong Wook ^e   Lee, Eunsongyi ^e   Lin, Chang You ^b   Van Dorpe, Pol ^a,b   Struyf, Herbert ^a   Holsteyns, Frank ^a   Moshchalkov, Victor ^b   Indekeu, Joseph ^b   De Gendt, Stefan ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d University of Southern California   (United States)

^e Ewha Womans University   (South Korea)

Author keywords

Cassie Baxter; hemiwicking; molecular dynamics simulations; nanoscale wetting; optical reflectance spectroscopy; transient states; Wenzel

Indexed keywords

CASSIE-BAXTER; HEMIWICKING; MOLECULAR DYNAMICS SIMULATIONS; NANO SCALE; OPTICAL REFLECTANCE; TRANSIENT STATE; WENZEL;

ASPECT RATIO; CRYSTALLOGRAPHY; FUNCTIONAL GROUPS; MOLECULAR DYNAMICS; NANOTECHNOLOGY; SILICON; WETTING;

SILICON WAFERS;

EID: 84893464898     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn405621w     Document Type: Article

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