Wetting of regularly structured gold surfaces

Langmuir

Volumn 21, Issue 5, 2005, Pages 1753-1757

  Abdelsalam, Mamdouh E ^a   Bartlett, Philip N ^a   Kelf, Timothy ^a   Baumberg, Jeremy ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT ANGLE; ELECTRODEPOSITION; GOLD; HYDROPHILICITY; INTERFACIAL ENERGY; MICROSTRUCTURE; POROUS MATERIALS; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY;

FILM THICKNESS; HYDROPHILLIC SURFACES; POROUS FILMS; SONICATION;

SELF ASSEMBLY;

EID: 14844336309     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la047468q     Document Type: Article

References (31)

1. Chen, W.; Fadeev, A. Y.; Hsieh, M. C.; Oner, D.; Youngblood, J.; McCarthy, T. J. Langmuir 1999, 15, 3395-3399.
2. Gau, H.; Herminghaus, S.; Lenz, P.; Lipowsky, R. Science 1999, 283, 46-49.
3. Lenz, P. Adv. Mater. 1999, 11, 1531-1534.
4. Yoo, D.; Shiratori, S. S.; Rubner, M. F. Macromolecules 1998, 31, 4309-4318.
5. Oner, D.; McCarthy, T. J. Langmuir 2000, 16, 7777-7782.
6. Mittal, K. L. Contact angle, wettability and adhesion; VSP: Utrecht, The Netherlands, 1993.
7. Miwa, M.; Nakajima, A.; Fujishima, A.;Hashimoto, K.; Watanabe, T. Langmuir 2000, 16, 5754-5760.
8. Sun, R.; Nakajima, A.; Fujishima, A.; Watanabe, T.; Hashimoto, K. J. Phys. Chem. B 2001, 105, 1984-1990.
9. Nakajima, A.; Fujishima, A.; Hashimoto, K.; Watanabe, T. Adv. Mater. 1999, 11, 1365-1368.
10. Yoshimitsu, Z.; Nanajima, A.; Watanabe, T.; Hashimoto, K. Langmmr 2002, 18, 5818-5822.
11. Patankar, N. A. Langmuir 2003, 19, 1249.
12. Hazlett, R. D. J. J. Colloid Interface Sci. 1990, 137, 527-533.
13. Bico, J.; Marzolin, C.; Quere, D. Europhys. Lett. 1999, 47, 220.
14. Krupenkin, T. N.; Taylor, J. A.; Schneider, T. M.; Yang, S. Langmuir 2004, 20, 3824-3827.
15. Shiu, J.-Y.; Kuo, C.-W.; Chen, P.; Mou, C.-Y. Chem. Mater. 2004, 16, 561-564.
16. Kasukawa, H.; Oshima, N.; Fujii, R. Zool. Sci. 1987, 4, 243-258.
17. Barthlott, W.; Neinhuis, C. Planta 1997, 202, 1-8.
18. Patankar, N. A. Langmuir 2004, 20, 8209-8213.
19. Ghiradella, H. AppL Opt. 1991, 30, 3492-3500.
20. Bergeron, V.; Quere, D. Phys. World 2001, 14, 2.
21. Bartlett, P. N.; Baumberg, J. J.; Coyle, S.; Abdelsalam, M. E. J. Chem. Soc., Faraday Discuss. 2003, 125, 117-132.
22. Bartlett, P. N.; Baumberg, J. J.; Birkin, P. R.; Ghanem, M. A.; Netti, M. C. Chem. Mater. 2002, 14, 2199-2208.
23. Wenzel, R. N. Ind. Eng. Chem. 1936, 28, 988-994.
24. Cassie, A. B. D.; Baxter, S. Trans. Faraday. Soc. 1944, 40, 546-551.
25. Swain, P. S.; Lipowsky, R. Langmuir 1998, 14, 6772-6780.
26. Lee, W.; Jin, M.-K.; Yoo, W.-C.; Lee, J.-K. Langmuir 2004, 20, 7665-7669.
27. He, B.; Patankar, N. A.; Lee, J. Langmuir 2003, 19, 4999-5003.
28. Gu,Z.-Z.; Uetsuka, H.; Takahashi, K.; Nakajima, A.; Onishi, H.; Fujishima, A.; Sato, O. Angew. Chem., Int. Ed. 2003, 42, 894-897.
29. Herminghaus, S. Europhys. Lett. 2000, 52, 165-170.
30. Patankar, N. A. Langmuir 2004, 20, 7097.
31. Lafuma, A.; Quere, D. Nat. Mater. 2003, 2, 457-460.