Characterization of the state of a droplet on a micro-textured silicon wafer using ultrasound

Journal of Applied Physics

Volumn 112, Issue 10, 2012, Pages

  Saad, N ^a,b   Dufour, R ^c,d   Campistron, P ^a   Nassar, G ^a   Carlier, J ^a   Harnois, M ^c   Merheb, B ^b   Boukherroub, R ^d   Senez, V ^c   Gao, J ^a   Thomy, V ^c   Ajaka, M ^b   Nongaillard, B ^a  

^a UNIVERSITÉ DE VALENCIENNES   (France)

^b LEBANESE UNIVERSITY   (Lebanon)

^c UNIV LILLE   (France)

^d CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC CHARACTERIZATION; EXPERIMENTAL MEASUREMENTS; LONGITUDINAL ACOUSTIC WAVES; MICRO-PILLARS; MULTIPLE REFLECTIONS; NUMERICAL CALCULATION; OPTICAL MEASUREMENT METHODS; SOLID-LIQUID; SOLID-VAPOR INTERFACE; SUPER-HYDROPHOBIC SURFACES;

ACOUSTICS; FINITE DIFFERENCE TIME DOMAIN METHOD; HYDROPHOBICITY; OPTICAL DATA PROCESSING; SILICON; SURFACE PROPERTIES; WETTING;

SILICON WAFERS;

EID: 84870696006     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4767223     Document Type: Article

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