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Volumn , Issue , 2007, Pages 347-365

Impact of the ROHS Directive on high-performance electronic systems Part II: Key reliability issues preventing the implementation of lead-free solders

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Indexed keywords


EID: 84892821360     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-0-387-48433-4_23     Document Type: Chapter
Times cited : (21)

References (60)
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    • R.D. Hilty, ECN, Nov. 1, 2005. http://www.ecnmag.com/article/CA6279217. html.
    • (2005) ECN
    • Hilty, R.D.1
  • 3
    • 33845687559 scopus 로고    scopus 로고
    • Dec. 22
    • J.F. Mason, Electronic News, Dec. 22, 2005. http://www.readelectronics. com/electronicnews/index.asp?layout=articleprint&articleID.
    • (2005) Electronic News
    • Mason, J.F.1
  • 4
    • 33845692885 scopus 로고    scopus 로고
    • Dec. 23
    • S. Deffree, Electronic News, Dec. 23, 2005. http://www.readelectronics. com/electronicnews/index.asp?layout=articlePrint&articleID.
    • (2005) Electronic News
    • Deffree, S.1
  • 7
    • 84892784882 scopus 로고    scopus 로고
    • Implementation of Lead-free Packages, Spansion, 2005, http://www.spansion.com/support/lead-free-flash/Lead-Free- Packages.html.
    • (2005) Implementation of Lead-free Packages
  • 8
    • 84870447881 scopus 로고    scopus 로고
    • Backward and Forward Compatibility, Dallas Semiconductor, http://www.maxim-ic.com/emmi/backward-forwards-compatibility.cfm.
    • Dallas Semiconductor
  • 9
    • 33845705032 scopus 로고    scopus 로고
    • Nov
    • R. Rowland, Surface Mount Technology, Nov. 2005, http://www.surfacemount. printthis.clickability.com/pt/cpt?action=cpt&title=surface+Mount+TEC.
    • (2005) Surface Mount Technology
    • Rowland, R.1
  • 11
    • 84892821886 scopus 로고    scopus 로고
    • Lead Free and ROHS Data, Freescale Semiconductor, 2004/2005, http://www.freescale.com/wehap/sps/site/overview.jsp?nodeId=061R7NMSSR.
    • (2004) Lead Free and ROHS Data
  • 60
    • 0242468675 scopus 로고    scopus 로고
    • Y.C. Hu et al., J. Mat. Res. 11 2544 (2003).
    • (2003) J. Mat. Res , vol.11 , pp. 2544
    • Hu, Y.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.