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Volumn 6, Issue 2, 2014, Pages 354-360

A unified drain-current model of silicon nanowire field-effect transistor (SiNWFET) for performance metric evaluation

Author keywords

Circuit; DIBL; GAA; I V Characteristics; Ion Ioff; MOSFET; SiNW; SS

Indexed keywords


EID: 84891818235     PISSN: 19472935     EISSN: 19472943     Source Type: Journal    
DOI: 10.1166/sam.2014.1723     Document Type: Article
Times cited : (9)

References (18)
  • 10
    • 49249139226 scopus 로고    scopus 로고
    • edited by A. Javey and J. Kong, Springer Science+Business Media, New York, USA
    • M. Hofmann, S. Bhaviripudi, and J. Kong, Carbon Nanotube Electronics, edited by A. Javey and J. Kong, Springer Science+Business Media, New York, USA (2009).
    • (2009) Carbon Nanotube Electronics
    • Hofmann, M.1    Bhaviripudi, S.2    Kong, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.