Sensitivity analysis of industrial multicrystalline PERC silicon solar cells by means of 3-D device simulation and metamodeling

IEEE Journal of Photovoltaics

Volumn 4, Issue 1, 2014, Pages 107-113

  Müller, Matthias ^a   Altermatt, Pietro P ^b   Wagner, Hannes ^b   Fischer, Gerd ^a  

^a Solar World Innovations GmbH   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

3 D device simulation; Crystalline Si solar cells; Metamodeling; Passivated emitter and rear cell (PERC); Sensitivity analysis

Indexed keywords

3D DEVICE SIMULATION; CRYSTALLINE SI SOLAR CELLS; FABRICATION PROCESS; METAMODELING; NONLINEAR INTERACTIONS; PASSIVATED EMITTER AND REAR CELL (PERC); RESPONSE SURFACE METHODOLOGY; THREEDIMENSIONAL (3-D);

EFFICIENCY; PASSIVATION; PRODUCTION ENGINEERING; REGRESSION ANALYSIS; SENSITIVITY ANALYSIS; SILICON SOLAR CELLS;

COMPUTER SIMULATION;

EID: 84891633474     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2287753     Document Type: Article

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