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Volumn 20, Issue 1, 2012, Pages 31-43

Modeling solar cells with the dopant-diffused layers treated as conductive boundaries

Author keywords

diffused layers; finite element modeling; free energy; solar cells

Indexed keywords

BACK SURFACE FIELDS; DEVICE PERFORMANCE; DIFFUSED LAYERS; ELECTRONS AND HOLES; EMITTER-WRAP-THROUGH; FINITE ELEMENT MODELING; FINITE-ELEMENT; FULLY-COUPLED; PARTIAL DIFFERENTIAL; POWER CONVERSION EFFICIENCIES; SATURATION CURRENT DENSITIES; SEMICONDUCTOR EQUATIONS; SURFACE REGION; TWO-DIMENSIONAL SIMULATIONS;

EID: 84855331023     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.954     Document Type: Article
Times cited : (72)

References (15)
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    • Bothe K, Sinton R, Schmidt J,. Formation rates of iron-acceptor pairs in crystalline silicon. Progress in Photovoltaics 2005; 13: 287.
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    • Bothe, K.1    Sinton, R.2    Schmidt, J.3
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    • Solar cells on low-resistivity boron-doped Czochralski-grown silicon with stabilized efficiencies of 20%
    • Lim B, Hermann S, Bothe K, Schmidt J, Brendel R,. Solar cells on low-resistivity boron-doped Czochralski-grown silicon with stabilized efficiencies of 20%. Applied Physics Letters 2008; 93: 162102.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.