SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 190, Issue PART A, 2013, Pages 106-112

Soft X-ray and electron spectroscopy to determine the electronic structure of materials for photoelectrochemical hydrogen production

(17) Weinhardt, L a,b,c Blum, M c Fuchs, O d Pookpanratana, S c George, K c Cole, B e Marsen, B e Gaillard, N e Miller, E e Ahn, K S f Shet, S f Yan, Y f Al Jassim, M M f Denlinger, J D g Yang, W g Bar M c,h,i Heske, C a,b,c

a KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

b KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

c UNIVERSITY OF NEVADA (United States)

d UNIVERSITY OF WÜRZBURG (Germany)

e UNIVERSITY OF HAWAII (United States)

f NATIONAL RENEWABLE ENERGY LABORATORY (United States)

g LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

h HAHN MEITNER INSTITUT (Germany)

i BRANDENBURG UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

Band edge positions; Hydrogen production; In situ; Photoelectrochemistry; Photoelectron spectroscopy; X ray emission spectroscopy

Indexed keywords

BAND EDGE POSITION; INVERSE PHOTOEMISSION; PHOTO-ELECTROCHEMISTRY; PHOTOELECTROCHEMICAL HYDROGEN PRODUCTION; PHOTOELECTROCHEMICAL WATER SPLITTING; SOFT X RAY EMISSION SPECTROSCOPY; UV PHOTOELECTRON SPECTROSCOPY; X RAY EMISSION SPECTROSCOPY;

ELECTROCHEMISTRY; ELECTRON SPECTROSCOPY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; HYDROGEN PRODUCTION; INTERFACES (MATERIALS); PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY; X RAYS;

SURFACES;

EID: 84890124613 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2012.11.015 Document Type: Article

Times cited : (10)

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