Core level and valence band investigation of WO3 thin films with synchrotron radiation

Thin Solid Films

Volumn 436, Issue 1, 2003, Pages 9-16

  Ottaviano, L ^a   Bussolotti, F ^a   Lozzi, L ^a   Passacantando, M ^a   La Rosa, S ^b   Santucci, S ^b  

^a UNIVERSITY OF L'AQUILA   (Italy)

^b SINCROTRONE TRIESTE   (Italy)

Author keywords

Photoelectron spectroscopy (PES); Scanning tunnelling microscopy (STM); Tungsten oxide

Indexed keywords

ANNEALING; COMPOSITION; ELECTRONIC PROPERTIES; EVAPORATION; PHOTOELECTRON SPECTROSCOPY; PHOTONS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SYNCHROTRON RADIATION; TUNGSTEN COMPOUNDS;

VALENCE BAND;

THIN FILMS;

EID: 0038378866     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00518-2     Document Type: Conference Paper

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