SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 190, Issue PART B, 2013, Pages 309-313

Chemical interaction at the buried silicon/zinc oxide thin-film solar cell interface as revealed by hard X-ray photoelectron spectroscopy

(14) Wimmer, M a Gerlach, D a Wilks, R G a Scherf, S a Felix R a Lupulescu, C b Ruske, F a Schondelmaier, G a Lips, K a Hupkes J c Gorgoi, M a Eberhardt, W a,b Rech, B a Bar M a,d

a HAHN MEITNER INSTITUT (Germany)

b TECHNISCHE UNIVERSITÄT BERLIN (Germany)

c FORSCHUNGSZENTRUM JÜLICH (Germany)

d BRANDENBURG UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

Elemental redistribution; HAXPES; Silicon thin film solar cell; Silicon zinc oxide interface; Zinc oxide

Indexed keywords

AMORPHOUS SILICON THIN FILMS; ELEMENTAL REDISTRIBUTION; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HAX-PES; OXIDE INTERFACES; SILICON THIN-FILM SOLAR CELLS; SOLID-PHASE CRYSTALLIZATION; THIN-FILM SOLAR CELLS;

ALUMINUM; PHOTOELECTRONS; SILICON OXIDES; SOLAR CELLS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS; ZINC; ZINC OXIDE;

ALUMINUM COATINGS;

EID: 84890119723 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2013.06.006 Document Type: Article

Times cited : (4)

References (22)

1
- 84855321124
- M.A. Green, K. Emery, Y. Hishikawa, W. Warta, and E.D. Dunlop Prog. Photovolt.: Res. Appl. 20 2012 12
- (2012) Prog. Photovolt.: Res. Appl. , vol.20 , pp. 12
- Green, M.A.¹ Emery, K.² Hishikawa, Y.³ Warta, W.⁴ Dunlop, E.D.⁵

2
- 1842781640
- K.L. Chopra, P.D. Paulson, and V. Dutta Prog. Photovolt.: Res. Appl. 12 2004 69
- (2004) Prog. Photovolt.: Res. Appl. , vol.12 , pp. 69
- Chopra, K.L.¹ Paulson, P.D.² Dutta, V.³

3
- 0032593265
- B. Rech, and H. Wagner Appl. Phys. A 69 1999 155
- (1999) Appl. Phys. A , vol.69 , pp. 155
- Rech, B.¹ Wagner, H.²

4
- 0033879621
- O. Vetterl, F. Finger, R. Carius, P. Hapke, L. Houben, O. Kluth, A. Lambertz, A. Mück, B. Rech, and H. Wagner Sol. Energy Mater. Sol. Cells 62 2000 97
- (2000) Sol. Energy Mater. Sol. Cells , vol.62 , pp. 97
- Vetterl, O.¹ Finger, F.² Carius, R.³ Hapke, P.⁴ Houben, L.⁵ Kluth, O.⁶ Lambertz, A.⁷ Mück, A.⁸ Rech, B.⁹ Wagner, H.¹⁰

5
- 67349240889
- M.A. Green Appl. Phys. A 96 2009 153
- (2009) Appl. Phys. A , vol.96 , pp. 153
- Green, M.A.¹

6
- 82355182871
- D. Amkreutz, J. Müller, M. Schmidt, T. Hänel, and T.F. Schulze Prog. Photovolt.: Res. Appl. 19 2011 937
- (2011) Prog. Photovolt.: Res. Appl. , vol.19 , pp. 937
- Amkreutz, D.¹ Müller, J.² Schmidt, M.³ Hänel, T.⁴ Schulze, T.F.⁵

7
- 30444449679
- F. Falk, and G. Andrä J. Cryst. Growth 287 2006 397
- (2006) J. Cryst. Growth , vol.287 , pp. 397
- Falk, F.¹ Andrä, G.²

8
- 84890126377
- Milan, Italy, 1783
- M.J. Keevers, T.L. Young, U. Schubert, and M.A. Green Proceedings of the 22nd European Photovoltaic Solar Energy Conference Milan, Italy, 1783 2007
- (2007) Proceedings of the 22nd European Photovoltaic Solar Energy Conference
- Keevers, M.J.¹ Young, T.L.² Schubert, U.³ Green, M.A.⁴

9
- 0033170236
- O. Kluth, B. Rech, L. Houben, S. Wieder, G. Schöpe, C. Beneking, H. Wagner, A. Löffl, and H.-W. Schock Thin Solid Films 351 1999 247
- (1999) Thin Solid Films , vol.351 , pp. 247
- Kluth, O.¹ Rech, B.² Houben, L.³ Wieder, S.⁴ Schöpe, G.⁵ Beneking, C.⁶ Wagner, H.⁷ Löffl, A.⁸ Schock, H.-W.⁹

10
- 78650133433
- Honolulu, USA, 614
- T. Sontheimer, C. Becker, F. Ruske, C. Klimm, U. Bloeck, S. Gall, O. Kunz, T. Young, R. Egan, J. Hüpkes, and B. Rech Proceedings of the 35th IEEE Photovoltaic Specialists Conference Honolulu, USA, 614 2010
- (2010) Proceedings of the 35th IEEE Photovoltaic Specialists Conference
- Sontheimer, T.¹ Becker, C.² Ruske, F.³ Klimm, C.⁴ Bloeck, U.⁵ Gall, S.⁶ Kunz, O.⁷ Young, T.⁸ Egan, R.⁹ Hüpkes, J.¹⁰ Rech, B.¹¹

11
- 70350707502
- C. Becker, F. Ruske, T. Sontheimer, B. Gorka, U. Bloeck, S. Gall, and B. Rech J. Appl. Phys. 106 2009 084506
- (2009) J. Appl. Phys. , vol.106 , pp. 084506
- Becker, C.¹ Ruske, F.² Sontheimer, T.³ Gorka, B.⁴ Bloeck, U.⁵ Gall, S.⁶ Rech, B.⁷

12
- 77956021408
- M. Bär, M. Wimmer, R.G. Wilks, M. Roczen, D. Gerlach, F. Ruske, K. Lips, B. Rech, L. Weinhardt, M. Blum, S. Pookpanratana, S. Krause, Y. Zhang, C. Heske, W. Yang, and J.D. Denlinger Appl. Phys. Lett. 97 2010 072105
- (2010) Appl. Phys. Lett. , vol.97 , pp. 072105
- Bär, M.¹ Wimmer, M.² Wilks, R.G.³ Roczen, M.⁴ Gerlach, D.⁵ Ruske, F.⁶ Lips, K.⁷ Rech, B.⁸ Weinhardt, L.⁹ Blum, M.¹⁰ Pookpanratana, S.¹¹ Krause, S.¹² Zhang, Y.¹³ Heske, C.¹⁴ Yang, W.¹⁵ Denlinger, J.D.¹⁶

13
- 80054977400
- M. Wimmer, M. Bär, D. Gerlach, R.G. Wilks, S. Scherf, C. Lupulescu, F. Ruske, R. Félix, J. Hüpkes, G. Gavrila, M. Gorgoi, K. Lips, W. Eberhardt, and B. Rech Appl. Phys. Lett. 99 2011 152104
- (2011) Appl. Phys. Lett. , vol.99 , pp. 152104
- Wimmer, M.¹ Bär, M.² Gerlach, D.³ Wilks, R.G.⁴ Scherf, S.⁵ Lupulescu, C.⁶ Ruske, F.⁷ Félix, R.⁸ Hüpkes, J.⁹ Gavrila, G.¹⁰ Gorgoi, M.¹¹ Lips, K.¹² Eberhardt, W.¹³ Rech, B.¹⁴

14
- 75649092628
- F. Ruske, M. Roczen, K. Lee, M. Wimmer, S. Gall, J. Hüpkes, D. Hrunski, and B. Rech J. Appl. Phys. 107 2010 013708
- (2010) J. Appl. Phys. , vol.107 , pp. 013708
- Ruske, F.¹ Roczen, M.² Lee, K.³ Wimmer, M.⁴ Gall, S.⁵ Hüpkes, J.⁶ Hrunski, D.⁷ Rech, B.⁸

15
- 61549107607
- M. Gorgoi, S. Svensson, F. Schäfers, G. Öhrwall, M. Mertin, P. Bressler, O. Karis, H. Siegbahn, A. Sandell, H. Rensmo, W. Doherty, C. Jung, W. Braun, and W. Eberhardt Nucl. Instrum. Method A 601 2009 48
- (2009) Nucl. Instrum. Method A , vol.601 , pp. 48
- Gorgoi, M.¹ Svensson, S.² Schäfers, F.³ Öhrwall, G.⁴ Mertin, M.⁵ Bressler, P.⁶ Karis, O.⁷ Siegbahn, H.⁸ Sandell, A.⁹ Rensmo, H.¹⁰ Doherty, W.¹¹ Jung, C.¹² Braun, W.¹³ Eberhardt, W.¹⁴

16
- 84890126901
- The Gaussian contributions to the Voigt profiles used to fit the Au 4f photoemission lines of a clean gold reference were taken as measure for the experimental resolution.
- The Gaussian Contributions to the Voigt Profiles Used to Fit the Au 4f Photoemission Lines of A Clean Gold Reference Were Taken As Measure for the Experimental Resolution

17
- 84890118617
- which is based on S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal. 21 (1993) 601
- IMFP values calculated for Si using the QUASES-IMFP-TPP2M code, www.quases.com, which is based on S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal. 21 (1993) 601.
- IMFP Values Calculated for Si Using the QUASES-IMFP-TPP2M Code

18
- 0004123419
- Cambridge University Press
- R.A. Street Hydrogenated Amorphous Silicon 1991 Cambridge University Press
- (1991) Hydrogenated Amorphous Silicon
- Street, R.A.¹

19
- 36149023238
- C.S. Fuller, and R.J. Morin Phys. Rev. 105 1957 379
- (1957) Phys. Rev. , vol.105 , pp. 379
- Fuller, C.S.¹ Morin, R.J.²

20
- 84890124964
- Provided that a sufficient HAXPES data basis (i.e., measurements at more excitation energies with high signal-to-noise ratio) would be available, one principally could model the data to derive composition profiles. However, this is not topic of this publication.
- Provided That A Sufficient HAXPES Data Basis (I.e., Measurements at More Excitation Energies with High Signal-to-noise Ratio) Would Be Available, One Principally Could Model the Data to Derive Composition Profiles. However, This Is Not Topic of This Publication

21
- 84873670822
- C. Becker, M. Pagels, C. Zachäus, B. Pollakowski, B. Beckhoff, B. Kanngießer, and B. Rech J. Appl. Phys. 113 2013 044519
- (2013) J. Appl. Phys. , vol.113 , pp. 044519
- Becker, C.¹ Pagels, M.² Zachäus, C.³ Pollakowski, B.⁴ Beckhoff, B.⁵ Kanngießer, B.⁶ Rech, B.⁷

22
- 77951171549
- M. Vinnichenko, R. Gago, S. Cornelius, N. Shevchenko, A. Rogozin, A. Kolitsch, F. Munnik, and W. Möller Appl. Phys. Lett. 96 2010 141907
- (2010) Appl. Phys. Lett. , vol.96 , pp. 141907
- Vinnichenko, M.¹ Gago, R.² Cornelius, S.³ Shevchenko, N.⁴ Rogozin, A.⁵ Kolitsch, A.⁶ Munnik, F.⁷ Möller, W.⁸

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.