Random vs realistic amorphous carbon models for high resolution microscopy and electron diffraction

Journal of Applied Physics

Volumn 114, Issue 21, 2013, Pages

  Ricolleau, C ^a   Le Bouar, Y ^b   Amara, H ^b   Landon Cardinal, O ^b,c   Alloyeau, D ^a  

^a UNIVERSITÉ PARIS DIDEROT   (France)

^b Centre National de la Recherche Scientifique   (France)

^c UNIVERSITÉ DE SHERBROOKE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SUBSTRATE; ELECTRON WAVE FUNCTIONS; HIGH RESOLUTION IMAGE; HIGH-RESOLUTION MICROSCOPY; ION-MILLING TECHNIQUE; LONG-RANGE ORDER PARAMETERS; STRUCTURAL MODELING; TIGHT-BINDING APPROXIMATIONS;

ATOMS; GOLD DEPOSITS; HIGH RESOLUTION ELECTRON MICROSCOPY;

AMORPHOUS CARBON;

EID: 84890105614     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4831669     Document Type: Article

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