TEM-simulation of amorphous carbon films: Influence of supercell packaging

Ultramicroscopy

Volumn 88, Issue 2, 2001, Pages 111-125

  Schultrich, Helga ^a   Schultrich, Bernd ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b FRAUNHOFER INSTITUTE FOR MATERIAL AND BEAM TECHNOLOGY IWS   (Germany)

Author keywords

Amorphous structure; Carbon; Simulation; Thin film

Indexed keywords

AMORPHOUS MATERIALS; CARBON; COMPUTER SIMULATION; DIAMONDS; GRAPHITE; THIN FILMS;

SUPERCELL PACKAGING;

TRANSMISSION ELECTRON MICROSCOPY;

CARBON;

ARTICLE; CONTROLLED STUDY; IMAGE ANALYSIS; NONHUMAN; SIMULATION; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE ANALYSIS AND ELECTRON MICROSCOPY;

EID: 0035018783     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(01)00069-9     Document Type: Article

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