Quantitative high-resolution transmission electron microscopy of single atoms

Microscopy and Microanalysis

Volumn 18, Issue 1, 2012, Pages 212-217

  Gamm, Björn ^a   Blank, Holger ^a   Popescu, Radian ^a   Schneider, Reinhard ^a   Beyer, André ^b   Gölzhäuser, Armin ^b   Gerthsen, Dagmar ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b BIELEFELD UNIVERSITY   (Germany)

Author keywords

absolute intensity scale; quantitative HRTEM; scattering factors; single atoms

Indexed keywords

EID: 84856017467     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611012232     Document Type: Conference Paper

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