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Volumn 114, Issue 21, 2013, Pages

Barrier height estimation of asymmetric metal-insulator-metal tunneling diodes

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL COMPONENT; CURRENT-VOLTAGE MEASUREMENTS; ELECTRIC FIELD MAGNITUDE; FOWLER-NORDHEIM PLOTS; FOWLER-NORDHEIM TUNNELING; METAL INSULATOR METALS; METAL-INSULATOR-METAL TUNNELING; TUNNELING CURRENT;

EID: 84890012103     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4839695     Document Type: Article
Times cited : (27)

References (21)
  • 3
    • 9144258943 scopus 로고
    • 10.1063/1.1702682
    • J. G. Simmons, J. Appl. Phys. 34, 1793 (1963). 10.1063/1.1702682
    • (1963) J. Appl. Phys. , vol.34 , pp. 1793
    • Simmons, J.G.1
  • 4
    • 36849139656 scopus 로고
    • 10.1063/1.1729774
    • J. G. Simmons, J. Appl. Phys. 34, 2581 (1963). 10.1063/1.1729774
    • (1963) J. Appl. Phys. , vol.34 , pp. 2581
    • Simmons, J.G.1
  • 6
    • 0032586251 scopus 로고    scopus 로고
    • 10.1016/S0304-3991(99)00097-2
    • R. G. Forbes, Ultramicroscopy 79, 11 (1999). 10.1016/S0304-3991(99)00097- 2
    • (1999) Ultramicroscopy , vol.79 , pp. 11
    • Forbes, R.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.