Advancing MIM electronics: Amorphous metal electrodes

Advanced Materials

Volumn 23, Issue 1, 2011, Pages 74-78

  Cowell III, E William ^a   Alimardani, Nasir ^a   Knutson, Christopher C ^b   Conley Jr , John F ^a   Keszler, Douglas A ^b   Gibbons, Brady J ^a   Wager, John F ^a  

^a Oregon State University   (United States)

^b OREGON STATE UNIVERSITY   (United States)

Author keywords

Charge Transport; Electrodes; Electronic Structures; Metals; Thin Films

Indexed keywords

AMORPHOUS METALS; ATOMICALLY SMOOTH SURFACE; CHARGE TRANSPORT; CONTACT LAYERS; METAL INSULATOR METALS; QUANTUM-MECHANICAL TUNNELING; ULTRATHIN DIELECTRICS;

AMORPHOUS FILMS; ELECTRODES; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; METAL INSULATOR BOUNDARIES; METALS; QUANTUM THEORY; ULTRATHIN FILMS;

MIM DEVICES;

METAL;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; ELECTRODE; ELECTRONICS; INSTRUMENTATION;

ELECTRIC CONDUCTIVITY; ELECTRODES; ELECTRONICS; METALS;

EID: 78650701433     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201002678     Document Type: Article

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