Size-dependent effects on the temperature coefficient of resistance of carbon nanotube vias

IEEE Transactions on Electron Devices

Volumn 60, Issue 12, 2013, Pages 4085-4089

  Vollebregt, Sten ^a   Banerjee, Sourish ^a   Beenakker, Kees ^a   Ishihara, Ryoichi ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Carbon nanotubes (CNT); electrical resistance; interconnections; temperature dependence

Indexed keywords

CARBON NANOTUBE VIAS; ELECTRICAL RESISTANCES; FOUR-POINT PROBE; INTERCONNECTIONS; SIMPLE MODELING; SIZE-DEPENDENT EFFECT; TEMPERATURE COEFFICIENT OF RESISTANCE; TEMPERATURE DEPENDENCE;

ELECTRIC RESISTANCE;

CARBON NANOTUBES;

EID: 84889603894     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2013.2287640     Document Type: Article

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