Physical modeling of temperature coefficient of resistance for single- and multi-wall carbon nanotube interconnects

IEEE Electron Device Letters

Volumn 28, Issue 2, 2007, Pages 135-138

  Naeemi, Azad ^a   Meindl, James D ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Conductivity; Interconnections; Modeling; Molecular electronics; Quantum wires; Temperature

Indexed keywords

INTERCONNECTION NETWORKS; MULTIWALLED CARBON NANOTUBES (MWCN); SEMICONDUCTOR QUANTUM WIRES; SINGLE-WALLED CARBON NANOTUBES (SWCN); THERMAL CONDUCTIVITY;

ELECTRON-PHONON SCATTERING MECHANISMS; TEMPERATURE COEFFICIENT OF RESISTANCE;

MOLECULAR ELECTRONICS;

EID: 33847406131     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2006.889240     Document Type: Article

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