Depth profiling with SNMS and SIMS of Zn(O,S) buffer layers for Cu(In,Ga)Se2 thin-film solar cells

Surface and Interface Analysis

Volumn 45, Issue 13, 2013, Pages 1811-1820

  Eicke, Axel ^a   Ciba, Thomas ^a   Hariskos, Dimitrios ^a   Menner, Richard ^a   Tschamber, Carsten ^a   Witte, Wolfram ^a  

^a ZENTRUM FÜR SONNENENERGIE UND WASSERSTOFF FORSCHUNG BADEN WÜRTTEMBERG ZSW   (Germany)

Author keywords

CIGS solar cells; depth profiles; quantification; SIMS; SNMS; Zn(O,S)

Indexed keywords

CIGS SOLAR CELLS; COMPOSITION PROFILE; EVALUATION ALGORITHM; QUANTIFICATION; SNMS; SUBSTRATE TEMPERATURE; THIN-FILM SOLAR CELLS; ZN(O ,S);

BUFFER LAYERS; CADMIUM SULFIDE; COPPER; DEPTH PROFILING; DIMERS; GALLIUM; ISOTOPES; OPEN CIRCUIT VOLTAGE; OPTICAL WAVEGUIDES; SECONDARY ION MASS SPECTROMETRY; SOLAR CELLS;

ZINC;

EID: 84887319095     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.5325     Document Type: Article

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