Microstructural characterization of chemical bath deposited and sputtered Zn(O,S) buffer layers

Thin Solid Films

Volumn 535, Issue 1, 2013, Pages 175-179

  Gautron, E ^a   Buffiere M ^a,b   Harel, S ^a   Assmann, L ^a   Arzel, L ^a   Brohan, L ^a   Kessler, J ^a,b   Barreau, N ^a  

^a UNIVERSITÉ DE NANTES   (France)

^b 44solar ^*  (France)

Author keywords

CBD; CIGSe; Cross sectional TEM; Microstructure; PVD; Zn(O,S) buffer layer

Indexed keywords

CBD; CHEMICAL-BATH DEPOSITION; CIGSE; CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; CROSS-SECTIONAL TEM; MICRO-STRUCTURAL CHARACTERIZATION; PHOTOVOLTAIC PERFORMANCE; ZN(O ,S);

BUFFER LAYERS; CRYSTALLITES; DEPOSITS; MICROSTRUCTURE; OPTICAL WAVEGUIDES; PHYSICAL VAPOR DEPOSITION; SEMICONDUCTING SELENIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE; ZINC SULFIDE;

ZINC;

EID: 84878189054     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.10.040     Document Type: Conference Paper

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