Studies of buried interfaces Cu(In,Ga)Se2/CdS XPS and electrical investigations

Thin Solid Films

Volumn 431-432, Issue , 2003, Pages 289-295

  Canava, B ^a   Vigneron, J ^a   Etcheberry, A ^a   Guimard, D ^b   Grand, P P ^b   Guillemoles, J F ^b   Lincot, D ^b   Ould Saad Hamatly, S ^c   Djebbour, Z ^c   Mencaraglia, D ^c  

^a UNIVERSITÉ DE VERSAILLES SAINT QUENTIN EN YVELINES   (France)

^b PSL RESEARCH UNIVERSITY   (France)

^c UNIV PARIS SUD   (France)

Author keywords

Buried interface; CuInSe2; Electrical response; Surface treatments; XPS

Indexed keywords

COMPOSITION; ELECTRIC ADMITTANCE; HETEROJUNCTIONS; INTERFACES (MATERIALS); SEMICONDUCTING FILMS; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

ADMITTANCE SPECTROSCOPY;

CADMIUM SULFIDE SOLAR CELLS;

EID: 0038356615     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00273-6     Document Type: Conference Paper

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