Chemical surface and thin film analysis in glass coating

Glass Science and Technology: Glastechnische Berichte

Volumn 70, Issue 11, 1997, Pages 340-353

  Oechsner, Hans ^a  

^a University of Koblenz Landau   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3643055186     PISSN: 09467475     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (29)

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8. Chu, W.-K.; Mayer, J. W.; Nicolet, M.-A.: Backscattering spectrometry. New York (et al): Acad. Press, 1978.
9. Teo, B. K.; Joy, D. C. (eds.): EXAFS spectroscopy. Techniques and applications. New York (et al.): Plenum Press, 1981.
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25. Oechsner, H.: Analysis of insulator samples by secondary neutral mass spectrometry. Scan. Microsc. 3 (1989) p. 411-418.
26. Oechsner, H.: Secondary neutral mass spectrometry (SNMS) - Recent methodical progress and applications to fundamental studies in particle/surface interaction. Int. J. Mass Spectrom. Ion Processes 143 (1995) p. 271-282.
27. Ambos, R.; Rädlein, E.; Frischat, G. H.: Surface analysis of sol-gel coatings on glass by secondary neutral mass spectrometry. Fresenius J. Anal. Chem. 353 (1995) p. 614-618.
28. Wucher, A.; Oechsner, H.: Depth scale calibration during sputter removal of multilayer systems by SNMS. Fresenius J. Anal. Chem. 333 (1989) p. 470-473.
29. Bieck, W.; Gnaser, H.; Oechsner, H.: Analytical performance of a secondary-neutral microprobe with electron-gas postionization and magnetic-sector mass spectrometer. J. Vac. Sci. Technol. A12 (1994) p. 2537-2543.