Enhancements in specimen preparation of Cu(In,Ga)(S,Se) 2 thin films

Micron

Volumn 43, Issue 2-3, 2012, Pages 470-474

  Abou Ras, D ^a   Marsen, B ^a   Rissom, T ^a   Frost, F ^b   Schulz, H ^c   Bauer, F ^d   Efimova, V ^e   Hoffmann, V ^e   Eicke, A ^f  

^a HAHN MEITNER INSTITUT   (Germany)

^b LEIBNIZ INSTITUTE OF SURFACE ENGINEERING IOM   (Germany)

^c CARL ZEISS SMT AG   (Germany)

^d Oxford Instruments GmbH   (Germany)

^e IFW DRESDEN   (Germany)

^f ZENTRUM FÜR SONNENENERGIE UND WASSERSTOFF FORSCHUNG BADEN WÜRTTEMBERG ZSW   (Germany)

Author keywords

3D EBSD; Cu agglomerates; Cu(In,Ga)(S,Se) 2 thin film solar cells; FIB; GD OES; SIMS

Indexed keywords

3D EBSD; CU(IN ,GA)(S ,SE)2; CU(IN,GA)(S,SE) 2 THIN FILM SOLAR CELLS; FIB; GD-OES; HIGH QUALITY; ION-BEAM SPUTTERING; MATERIAL SYSTEMS; REACTIVE GAS; SEM IMAGING; THIN FILM STACKS; THREE-DIMENSIONAL ELECTRONS;

AGGLOMERATION; DEPTH PROFILING; ION BEAMS; IONS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SELENIUM COMPOUNDS; SPECIMEN PREPARATION; THIN FILMS; THREE DIMENSIONAL;

COPPER;

EID: 84855218659     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.11.004     Document Type: Article

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