Current calculation on VLSI signal interconnects

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn , Issue , 2005, Pages 580-585

  Shao, Muzhou ^a   Gao, Youxin ^a   Yuan, Li Pen ^a   Chen, Hung Ming ^b   Wong, Martin D F ^c  

^a SYNOPSYS INC   (United States)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATION TECHNIQUES; COMPREHENSIVE RELIABILITY; CRITICAL CHALLENGES; DEEP SUB-MICRON; EFFECTIVE SOLUTION; PRUNING TECHNIQUES; TIME-DOMAIN CIRCUITS; WORKING FREQUENCY;

DESIGN; ELECTROMIGRATION; RELIABILITY;

TIME DOMAIN ANALYSIS;

EID: 84886651918     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2005.36     Document Type: Conference Paper

References (15)

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