메뉴 건너뛰기




Volumn 2003-January, Issue , 2003, Pages 37-42

A fast and accurate method for interconnect current calculation

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATION; COMPUTER AIDED DESIGN; DESIGN; ERRORS; FORESTRY; INTEGRATED CIRCUIT DESIGN; INTEGRATED CIRCUIT INTERCONNECTS;

EID: 77952663397     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2003.1194990     Document Type: Conference Paper
Times cited : (8)

References (17)
  • 3
    • 0025435021 scopus 로고
    • Projecting interconnect elettomigration lifetime for arbitrary current waveform
    • B.-K. Liew; N.W. Cheung; C. Hu, "Projecting interconnect elettomigration lifetime for arbitrary current waveform," IEEE Trans. on Electron Devices, vol.37, pp.1343-1351, 1990.
    • (1990) IEEE Trans. on Electron Devices , vol.37 , pp. 1343-1351
    • Liew, B.-K.1    Cheung, N.W.2    Hu, C.3
  • 4
    • 0026954492 scopus 로고
    • Circuit reliability simulator for interconnect, via, and contact electromigration
    • Nov.
    • B.-K. Liew; P. Fang; N.W. Cheung; C. Hu, "Circuit reliability simulator for interconnect, via, and contact electromigration",," IEEE Trans. Electron Devices, vol. 39, pp. 2472-2479, Nov. 1992.
    • (1992) IEEE Trans. Electron Devices , vol.39 , pp. 2472-2479
    • Liew, B.-K.1    Fang, P.2    Cheung, N.W.3    Hu, C.4
  • 5
    • 0030243163 scopus 로고    scopus 로고
    • Electromigration: The time bomb in deep-submicron ICs
    • Sept.
    • Ping-Chung Li, Young, T.K, "Electromigration: the time bomb in deep-submicron ICs", IEEE Spectrum, Vol. 33 Sept., pp 75-78, 1996.
    • (1996) IEEE Spectrum , vol.33 , pp. 75-78
    • Li, P.-C.1    Young, T.K.2
  • 6
    • 0024865572 scopus 로고
    • Characterization of Electromigration Under Bidirectional (BC) and Pulsed Unidirectional (PDC) Currents
    • I. A. Maiz, "Characterization of Electromigration Under Bidirectional (BC) and Pulsed Unidirectional (PDC) Currents", Proc. of Intl. Reliability Physics Symposium, pp. 220-228, 1989.
    • (1989) Proc. of Intl. Reliability Physics Symposium , pp. 220-228
    • Maiz, I.A.1
  • 8
    • 0025414182 scopus 로고
    • Asymptotic waveform evaluation for timing analysis
    • Apr.
    • L. T. Pillage and R. A. Rohrer, "Asymptotic waveform evaluation for timing analysis," IEEE Trans. Computer-Aided Design, vol. 9, pp.352-366, Apr. 1990.
    • (1990) IEEE Trans. Computer-Aided Design , vol.9 , pp. 352-366
    • Pillage, L.T.1    Rohrer, R.A.2
  • 13
    • 0029710528 scopus 로고    scopus 로고
    • An Explicit RC-Circuit Delay Approximation Based on the First Three Moments of the Impulse Response
    • June
    • Bogdan Tutuianu; Florentin Dartu; Lawrence T. Pileggi, "An Explicit RC-Circuit Delay Approximation Based on the First Three Moments of the Impulse Response ", Proceedings of 33th Design Automation Conference, June 1996.
    • (1996) Proceedings of 33th Design Automation Conference
    • Tutuianu, B.1    Dartu, F.2    Pileggi, L.T.3
  • 14
    • 0028413845 scopus 로고
    • An electromigration failure model for interconnects under pulsed and bidirectional current stressing
    • Apr.
    • Jiang Tao; Cheung, N.W.; Chenming Hu, "An electromigration failure model for interconnects under pulsed and bidirectional current stressing," IEEE Trans. Electron Devices, vol. 41, pp. 539-545, Apr. 1994.
    • (1994) IEEE Trans. Electron Devices , vol.41 , pp. 539-545
    • Tao, J.1    Cheung, N.W.2    Hu, C.3
  • 16
  • 17
    • 0028448170 scopus 로고
    • Failure Mechanism Models for Electromigration
    • D. Young, A. Christou, "Failure Mechanism Models for Electromigration", IEEE Trans. on Reliability, Vol. 43, no. 2, pp. 186-192, 1994.
    • (1994) IEEE Trans. on Reliability , vol.43 , Issue.2 , pp. 186-192
    • Young, D.1    Christou, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.