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Volumn , Issue , 1997, Pages 224-229
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CMOS gate delay models for general RLC loading
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
CAPACITANCE;
ELECTRIC LOADS;
ELECTRIC RESISTANCE;
GATES (TRANSISTOR);
MATHEMATICAL MODELS;
THEVENIN EQUIVALENT CEFF MODELS;
CMOS INTEGRATED CIRCUITS;
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EID: 0031333601
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (47)
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References (9)
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