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Physical Review Letters

Volumn 111, Issue 14, 2013, Pages

Quantum metrology with a scanning probe atom interferometer

(4) Ockeloen, Caspar F a Schmied, Roman a Riedel, Max F a Treutlein, Philipp a

a UNIVERSITY OF BASEL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATIONS IN COMMUNICATIONS; BOSE-EINSTEIN CONDENSATES; HIGH SPATIAL RESOLUTION; HIGH-RESOLUTION MEASUREMENTS; INTERFEROMETRIC SCANNING; MICROWAVE MAGNETIC FIELD; QUANTUM-INFORMATION PROCESSING; STANDARD QUANTUM LIMITS;

ATOMS; BOSE-EINSTEIN CONDENSATION; INTERFEROMETERS; MEASUREMENTS; MICROWAVE CIRCUITS; UNITS OF MEASUREMENT;

QUANTUM ENTANGLEMENT;

EID: 84885167540 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.111.143001 Document Type: Article

Times cited : (224)

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