Advances in quantum metrology

Nature Photonics

Volumn 5, Issue 4, 2011, Pages 222-229

  Giovannetti, Vittorio ^a   Lloyd, Seth ^b   MacCone, Lorenzo ^c  

^a ISTITUTO NANOSCIENZE CNR   (Italy)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79953645306     PISSN: 17494885     EISSN: 17494893     Source Type: Journal    
DOI: 10.1038/nphoton.2011.35     Document Type: Review

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