Long-range order in electronic transport through disordered metal films

Science

Volumn 319, Issue 5867, 2008, Pages 1226-1229

  Aigner, S ^a,b   Della Pietra, L ^a   Japha, Y ^c   Entin Wohlman, O ^c   David, T ^c   Salem, R ^c   Folman, R ^c   Schmiedmayer, J ^a,b  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b TU WIEN   (Austria)

^c BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

METAL;

CRYSTAL; GOLD; GRAIN SIZE; MAGNETIC FIELD; MAGNETOMETER; METAL; SENSITIVITY ANALYSIS;

ARTICLE; ATOM; CONDUCTANCE; ELECTRON TRANSPORT; FOURIER TRANSFORMATION; MAGNETIC FIELD; PRIORITY JOURNAL; ROOM TEMPERATURE; SENSITIVITY ANALYSIS; SPECTRUM; THICKNESS;

EID: 40049103453     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1152458     Document Type: Article

References (21)

1. E. H. Sondheimer, Adv. Phys. 1, 1 (1952).
2. R. G. Chambers, Proc. R. Soc. London Ser. A 202, 378 (1950).
3. A. F. Mayadas, M. Shatzkes, Phys. Rev. B 1, 1382 (1970).
4. R. Landauer, IBM J. Res. Dev. 1, 223 (1957).
5. S. Wildermuth et al., Nature 435, 440 (2005).
6. S. Wildermuth et al., Appl. Phys. Lett. 88, 264103 (2006).
7. R. Folman, P. Krüger, J. Schmiedmayer, J. Denschlag, C. Henkel, Adv. At. Mol. Opt. Phys. 48, 263 (2002).
8. J. Reichel, Appl. Phys. B 74, 469 (2002).
9. J. Fortagh, J. C. Zimmermann, Rev. Mod. Phys. 79, 235 (2007).
10. See supporting material on Science Online.
11. The chip was fabricated at the Weiss Family Laboratory for Nanoscale Systems, Ben-Gurion University, Israel (www.bgu.ac.il/nanofabrication).
12. W. Steinhögl, G. Schindler, G. Steinlesberger, M. Engelhardt, Phys. Rev. B 66, 075414 (2002).
13. M. A. Schneider, M. Wenderoth, A. J. Heinrich, M. A. Rosentreter, R. G. Ulbrich, Appl. Phys. Lett. 69, 1327 (1996).
14. D.-W. Wang, M. D. Lukin, E. Demler, Phys. Rev. Lett. 92, 076802 (2004).
15. T. Schumm et al., Eur. Phys. J. D 32, 171 (2005).
16. S. Groth et al., Appl. Phys. Lett. 85, 2980 (2004).
17. P. Krüger et al., Phys. Rev. A 76, 063621 (2007).
18. D. A. Bonn, Nat. Phys. 2, 159 (2006).
19. S. Ilani, A. Yacoby, D. Mahalu, H. Shtrikman, Science 292, 1354 (2001).
20. J. Feist et al., Phys. Rev. Lett. 97, 116804 (2006).
21. We thank the team of the Ben-Gurion University Weiss Family Laboratory for Nanoscale Systems for the fabrication of the chip, and J. Jopp of the Ben-Gurion University Ilse Katz Center for Nanoscale Science for assisting with surface measurements. R.F. thanks Y. Imry and A. Klug for their continued support. Supported by the Fonds zur Förderung der Wissenschaftlichen Forschung, Deutsche Forschungsgemeinschaft, German Federal Ministry of Education and Research (Deutsch-Israelische Projektkooperation), European Community "Atomchip" Research Training Network, American-Israeli Binational Science Foundation, and Israeli Science Foundation.