Atom-chip-based generation of entanglement for quantum metrology

Nature

Volumn 464, Issue 7292, 2010, Pages 1170-1173

  Riedel, Max F ^a,b   Böhi, Pascal ^a,b   Li, Yun ^c,d   Hänsch Signnsch, Theodor W ^a,b   Sinatra, Alice ^c   Treutlein, Philipp ^a,b,e  

^a UNIVERSITY OF MUNICH   (Germany)

^b MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^c LABORATOIRE KASTLER BROSSEL   (France)

^d EAST CHINA NORMAL UNIVERSITY   (China)

^e UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODYNAMICS; INTERFEROMETER; QUANTUM MECHANICS; SIMULATION;

ARTICLE; ATOM; INTERFEROMETRY; PRIORITY JOURNAL; QUANTUM THEORY; TOMOGRAPHY;

EID: 77951536091     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature08988     Document Type: Article

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