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Volumn 545, Issue , 2013, Pages 217-221
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Application of scanning microscopy to study correlation between thermal properties and morphology of BaTiO3 thin films
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Author keywords
Atomic; Barium titanate; Force; Microscopy; Scanning; Thermal Microscopy; Thermal properties; Thin films
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Indexed keywords
ATOMIC;
COMPARISON OF MEASUREMENTS;
DEPOSITION PARAMETERS;
FORCE;
QUANTITATIVE CHARACTERIZATION;
RANDOMLY DISTRIBUTED;
SCANNING THERMAL MICROSCOPY;
THERMAL MICROSCOPY;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
BARIUM TITANATE;
DEPOSITION;
MICROSCOPIC EXAMINATION;
MORPHOLOGY;
SCANNING;
THERMODYNAMIC PROPERTIES;
THIN FILMS;
THERMAL CONDUCTIVITY;
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EID: 84884989454
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2013.08.007 Document Type: Article |
Times cited : (19)
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References (26)
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