Atomic force microscopy studies of twins in yttrium-doped barium titanate

Journal of Physics and Chemistry of Solids

Volumn 67, Issue 11, 2006, Pages 2253-2256

  Gheno, Simoni Maria ^a   Hasegawa, Haroldo Lhou ^a   Filho, Pedro Iris Paulin ^a  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

A. Ceramics; D. Semiconductivity

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE PROCESSING; MICROSTRUCTURE; SEMICONDUCTOR DOPING; SURFACE TOPOGRAPHY; YTTRIUM COMPOUNDS;

DOUBLE TWINS; PROCESSING PARAMETERS; TOPOGRAPHIC IMAGES;

BARIUM TITANATE;

EID: 33749260754     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2006.05.046     Document Type: Review

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