SCOPUS 정보 검색 플랫폼

Volumn 34, Issue 4, 2013, Pages 620-628

DC experiments in quantitative scanning thermal microscopy

(3) Juszczyk, J a Wojtol, M a Bodzenta, J a

a SILESIAN UNIVERSITY OF TECHNOLOGY (Poland)

Author keywords

Finite element method; Nanofabricated thermal probe; Quantitative thermal measurements; Scanning thermal microscopy; Thermal conductivity

Indexed keywords

AMBIENT CONDITIONS; DIFFERENT MATERIALS; NUMERICAL RESULTS; SCANNING THERMAL MICROSCOPE; SCANNING THERMAL MICROSCOPY; THEORETICAL MODELS; THERMAL MEASUREMENTS; THERMAL PROBE;

FINITE ELEMENT METHOD; MOLECULES; PROBES; SCANNING;

THERMAL CONDUCTIVITY;

EID: 84878778724 PISSN: 0195928X EISSN: None Source Type: Journal
DOI: 10.1007/s10765-013-1449-4 Document Type: Article

Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.