SCOPUS 정보 검색 플랫폼

Volumn 31, Issue 1, 2010, Pages 150-162

Analysis of possibilities of application of nanofabricated thermal probes to quantitative thermal measurements

(4) Bodzenta, Jerzy a Kaźmierczak Bałata, Anna a Lorenc, MacIej a Juszczyk, Justyna a

a SILESIAN UNIVERSITY OF TECHNOLOGY (Poland)

Author keywords

Finite element analysis; Nanofabricated thermal probe; Scanning thermal microscopy; Thermal conductivity; Thermal measurement

Indexed keywords

ACTIVE MODE; ELECTRICAL RESISTANCES; FINITE ELEMENT ANALYSIS; MAXIMUM SENSITIVITY; METROLOGICAL CHARACTERISTICS; PROBE APEX; RESISTIVE TYPE; SAMPLE SYSTEM; SCANNING THERMAL MICROSCOPY; SPATIAL RESOLUTION; TEMPERATURE FIELD; THERMAL MEASUREMENTS; THERMAL MODEL; THERMAL PROBE; THERMAL RESISTANCE;

FINITE ELEMENT METHOD; THERMAL CONDUCTIVITY; THERMAL VARIABLES MEASUREMENT; THERMOANALYSIS;

PROBES;

EID: 77249090672 PISSN: 0195928X EISSN: None Source Type: Journal
DOI: 10.1007/s10765-009-0659-2 Document Type: Article

Times cited : (20)

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