메뉴 건너뛰기




Volumn 60, Issue 10, 2013, Pages 3407-3412

Gigahertz operation of a-IGZO schottky diodes

Author keywords

Amorphous indium gallium zinc oxide (a IGZO); amorphous oxide semiconductor (AOS); doping; radio frequency; Schottky diode

Indexed keywords

AMORPHOUS INDIUM GALLIUM ZINC OXIDES (A IGZO); AMORPHOUS OXIDE SEMICONDUCTORS; DOPING CONCENTRATION; ELECTRICAL MEASUREMENT; RADIO FREQUENCIES; SCHOTTKY DIODES; SEMICONDUCTOR LAYERS; VERTICAL SCHOTTKY DIODES;

EID: 84884676549     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2013.2275250     Document Type: Article
Times cited : (68)

References (12)
  • 3
    • 33745263960 scopus 로고    scopus 로고
    • Comparison of organic diode structures regarding high-frequency rectification behavior in radio-frequency identification tags
    • Jun
    • S. Steudel, S. De Vusser, K. Myny, M. Lenes, J. Genoe, and P. Heremans, "Comparison of organic diode structures regarding high-frequency rectification behavior in radio-frequency identification tags," J. Appl. Phys., vol. 99, no. 11, pp. 114519-1-114519-7, Jun. 2006.
    • (2006) J. Appl. Phys. , vol.99 , Issue.11 , pp. 1145191-1145197
    • Steudel, S.1    De Vusser, S.2    Myny, K.3    Lenes, M.4    Genoe, J.5    Heremans, P.6
  • 4
    • 79952586175 scopus 로고    scopus 로고
    • Towards gigahertz operation: Ultrafast low turn-on organic diodes and rectifiers based on C60 and tungsten oxide
    • Feb
    • D. Im, H. Moon, M. Shin, J. Kim, and S. Yoo, "Towards gigahertz operation: Ultrafast low turn-on organic diodes and rectifiers based on C60 and tungsten oxide," Adv. Mater., vol. 23, no. 5, pp. 644-648, Feb. 2011.
    • (2011) Adv. Mater. , vol.23 , Issue.5 , pp. 644-648
    • Im, D.1    Moon, H.2    Shin, M.3    Kim, J.4    Yoo, S.5
  • 5
    • 9744248669 scopus 로고    scopus 로고
    • Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors
    • DOI 10.1038/nature03090
    • K. Nomura, H. Otha, A. Takagi, T. Kamiya, M. Hirano, and H. Hosono, "Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors," Nature, vol. 432, no. 7016, pp. 488-492, 2004. (Pubitemid 39585210)
    • (2004) Nature , vol.432 , Issue.7016 , pp. 488-492
    • Nomura, K.1    Ohta, H.2    Takagi, A.3    Kamiya, T.4    Hirano, M.5    Hosono, H.6
  • 6
  • 7
    • 80054928190 scopus 로고    scopus 로고
    • Electrical characteristics of Pt Schottky contacts fabricated on amorphous gallium indium zinc oxides
    • Oct.
    • H. Kim, S. Kim, K.-K. Kim, S.-N. Lee, and K.-S. Ahn, "Electrical characteristics of Pt Schottky contacts fabricated on amorphous gallium indium zinc oxides," Jpn. J. Appl. Phys., vol. 50, pp. 105702-1-105702-3, Oct. 2011.
    • (2011) Jpn. J. Appl. Phys. , vol.50 , pp. 1057021-1057023
    • Kim, H.1    Kim, S.2    Kim, K.-K.3    Lee, S.-N.4    Ahn, K.-S.5
  • 8
    • 81855185546 scopus 로고    scopus 로고
    • Diffusion-limited a-IGZO/Pt Schottky junction fabricated at 200 °c on a flexible substrate
    • Dec
    • D. H. Lee, K. Nomura, T. Kamiya, and H. Hosono, "Diffusion-limited a-IGZO/Pt Schottky junction fabricated at 200 °C on a flexible substrate," IEEE Electron Device Lett., vol. 32, no. 12, pp. 1695-1697, Dec. 2011.
    • (2011) IEEE Electron Device Lett. , vol.32 , Issue.12 , pp. 1695-1697
    • Lee, D.H.1    Nomura, K.2    Kamiya, T.3    Hosono, H.4
  • 11
    • 78149382528 scopus 로고    scopus 로고
    • Present status of amorphous In-Ga-Zn-O thin-film transistors
    • Aug
    • T. Kamiya, K. Nomura, and H. Hosono, "Present status of amorphous In-Ga-Zn-O thin-film transistors," Sci. Technol. Adv. Mater., vol. 11, no. 4, pp. 044305-1-044305-23, Aug. 2010.
    • (2010) Sci. Technol. Adv. Mater. , vol.11 , Issue.4 , pp. 0443051-04430523
    • Kamiya, T.1    Nomura, K.2    Hosono, H.3
  • 12
    • 21844451632 scopus 로고    scopus 로고
    • 4
    • DOI 10.1016/j.tsf.2004.11.223, PII S0040609004018899
    • A. Takagi, K. Nomura, H. Ohta, T. Kamiya, M. Hirano, and H. Hosono, "Carrier transport and electronic structure in amorphous oxide semiconductor, a-InGaZnO4," Thin Solid Films, vol. 486, nos. 1-2, pp. 38-41, Aug. 2005. (Pubitemid 40952537)
    • (2005) Thin Solid Films , vol.486 , Issue.1-2 , pp. 38-41
    • Takagi, A.1    Nomura, K.2    Ohta, H.3    Yanagi, H.4    Kamiya, T.5    Hirano, M.6    Hosono, H.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.