Variation of microstructural and optical properties in SILAR grown ZnO thin films by thermal treatment

Journal of Nanoscience and Nanotechnology

Volumn 13, Issue 8, 2013, Pages 5613-5619

  Valanarasu, S ^a   Dhanasekaran, V ^b   Chandramohan, R ^c   Kulandaisamy, I ^a   Sakthivelu, A ^d   Mahalingam, T ^e  

^a ARUL ANANDAR COLLEGE   (India)

^b ALAGAPPA UNIVERSITY   (India)

^c Sree Sevugan Annamalai College   (India)

^d Periyar EVR College   (India)

^e KARUNYA UNIVERSITY   (India)

Author keywords

Annealing Effect; Microstructural Studies; Thin Films; ZnO Nanorods

Indexed keywords

ANNEALING EFFECTS; ANNEALING TEMPERATURES; DISLOCATION DENSITIES; MICRO-STRUCTURAL; MICROSTRUCTURAL CHANGES; PREFERENTIAL ORIENTATION; STRUCTURAL AND MORPHOLOGICAL PROPERTIES; ZNO NANOROD;

METALLIC FILMS; NANORODS; OPTICAL FILMS; OPTICAL PROPERTIES; THIN FILMS; ZINC OXIDE;

ANNEALING;

EID: 84883404862     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2013.7473     Document Type: Article

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