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Volumn 9, Issue 3, 2008, Pages
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Optimization of growth conditions of ZnO nano thin films by chemical double dip technique
b
Ananda College
(India)
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Author keywords
AFM; Chemical deposition; SEM; XPS; ZnO
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
METALLIC FILMS;
MICROSCOPES;
OXIDE FILMS;
OXYGEN;
PHOTOELECTRON SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING ZINC COMPOUNDS;
SOLIDS;
SURFACE MORPHOLOGY;
THIN FILMS;
X RAY ANALYSIS;
X RAY DIFFRACTION ANALYSIS;
ZINC;
ZINC OXIDE;
AFM;
CHEMICAL DEPOSITION;
SEM;
XPS;
ZNO;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 58149384623
PISSN: 14686996
EISSN: None
Source Type: Journal
DOI: 10.1088/1468-6996/9/3/035007 Document Type: Article |
Times cited : (38)
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References (15)
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