Quantum resistance standard accuracy close to the zero-dissipation state

Journal of Applied Physics

Volumn 114, Issue 6, 2013, Pages

  Schopfer, F ^a   Poirier, W ^a  

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LANDAU LEVEL FILLING FACTORS; LONGITUDINAL RESISTIVITY; QUANTIZED HALL RESISTANCE; QUANTUM RESISTANCE; RELATIVE UNCERTAINTY; REPRODUCIBILITIES; RESISTANCE STANDARDS; WHEATSTONE BRIDGES;

BRIDGE CIRCUITS; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON GAS; HALL EFFECT DEVICES; QUANTUM HALL EFFECT;

QUANTUM THEORY;

EID: 84883375341     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4815871     Document Type: Article

References (38)

1. K. v. Klitzing, G. Dorda, and M. Pepper, Phys. Rev. Lett. 45, 494 (1980). 10.1103/PhysRevLett.45.494
2. D. Yoshioka, The Quantum Hall Effect (Springer, 1998).
3. B. Jeckelmann and B. Jeanneret, Rep. Prog. Phys. 64, 1603 (2001). 10.1088/0034-4885/64/12/201
4. W. Poirier and F. Schopfer, Eur. Phys. J. Spec. Top. 172, 207 (2009). 10.1140/epjst/e2009-01051-5
5. I. K. Harvey, Rev. Sci. Instrum. 43, 1626 (1972). 10.1063/1.1685508
6. F. J. Ahlers, B. Jeannneret, F. Overney, J. Schurr, and B. M. Wood, Metrologia 46, R1 (2009). 10.1088/0026-1394/46/5/R01
7. W. Poirier, A. Bounouh, K. Hayashi, F. Piquemal, G. Genevès, and J. P. André, J. Appl. Phys. 92, 2844 (2002). 10.1063/1.1495893
8. B. Jeanneret and S. P. Benz, Eur. Phys. J. Spec. Top. 172, 181 (2009). 10.1140/epjst/e2009-01050-6
9. F. Delahaye and B. Jeckelmann, Metrologia 40, 217 (2003). 10.1088/0026-1394/40/5/302
10. M. Buttiker, Phys. Rev. B 38, 9375 (1988). 10.1103/PhysRevB.38.9375
11. M. E. Cage, B. F. Field, R. F. Dziuba, S. M. Girvin, A. C. Gossard, and D. C. Tsui, Phys. Rev. B 30, 2286 (1984). 10.1103/PhysRevB.30.2286
12. W. van der Wel, C. J. P. M. Harmans, and J. E. Mooij, J. Phys. C 21, L171 (1988). 10.1088/0022-3719/21/7/003
13. D. Dominguez, Ph.D. dissertation, CNAM, Paris, 1987.
14. E. Granot, Physica B 292, 264 (2000). 10.1016/S0921-4526(00)00468-3
15. A. A. Penin, Phys. Rev. B. 79, 113303 (2009) 10.1103/PhysRevB.79.113303;
16. A. A. Penin, Phys. Rev. B. 81, 089902(E) (2010).
17. I. M. Mills, P. J. Mohr, T. J. Quinn, B. N. Taylor, and E. R. Williams, Metrologia 43, 227 (2006). 10.1088/0026-1394/43/3/006
18. A. Eichenberger, G. Genevès, and P. Gournay, Eur. Phys. J. Spec. Top. 172, 363 (2009). 10.1140/epjst/e2009-01061-3
19. A. Hartland, K. Jones, J. M. Williams, B. L. Gallagher, and T. Galloway, Phys. Rev. Lett. 66, 969 (1991). 10.1103/PhysRevLett.66.969
20. B. Jeckelmann, B. Jeanneret, and D. Inglis, Phys. Rev. B 55, 13124 (1997). 10.1103/PhysRevB.55.13124
21. W. Poirier and F. Schopfer, Nat. Nanotechnol. 5, 171 (2010). 10.1038/nnano.2010.40
22. A. Tzalenchuk, S. Lara-Avila, A. Kalaboukhov, S. Paolillo, M. S. Syvajarvi, R. Yakimova, O. Kazakova, T. J. B. M. Janssen, V. Falko, and S. Kubatkin, Nat. Nanotechnol. 5, 186 (2010). 10.1038/nnano.2009.474
23. T. J. B. M. Janssen, N. Fletcher, R. Goebel, J. Williams, A. Tzalenchuk, R. Yakimova, S. Kubatkin, S. Lara-Avila, and V. Falko, New J. Phys. 13, 093026 (2011). 10.1088/1367-2630/13/9/093026
24. J. Guignard, D. Leprat, D. C. Glattli, F. Schopfer, and W. Poirier, Phys. Rev. B 85, 165420 (2012). 10.1103/PhysRevB.85.165420
25. F. J. Ahlers, E. Pesel, K. Pierz, P. Warnecke, and W. Wegscheider, in 2008 CPEM Digest, Boulder, edited by, A. H. Cookson, and, T.-L. Winter, (IEEE Trans. Instrum., 2008), p. 16.
26. F. Schopfer and W. Poirier, J. Appl. Phys. 102, 054903 (2007). 10.1063/1.2776371
27. F. Piquemal, G. Genevès, F. Delahaye, J. P. André, J. N. Patillon, and P. Frijlink, IEEE Trans. Instrum. Meas. 42, 264 (1993). 10.1109/19.278562
28. W. Poirier, F. Schopfer, J. Guignard, O. Thévenot, and P. Gournay, C.R. Acad. Sci. 12, 347 (2011). 10.1016/j.crhy.2011.04.008
29. F. Delahaye, J. Appl. Phys. 73, 7914 (1993). 10.1063/1.353944
30. B. I. Shklovskii and A. L. Efros, Electronic Properties of Doped Semiconductors (Springer, 1984).
31. A. M. Chang and D. C. Tsui, Solid State Commun. 56, 153 (1985). 10.1016/0038-1098(85)90555-1
32. T. Rötger, G. J. C. L. Bruls, J. C. Maan, P. Wyder, K. Ploog, and G. Wiemann, Phys. Rev. Lett. 62, 90 (1989). 10.1103/PhysRevLett.62.90
33. H. Stormer, K. Baldwin, L. N. Pfeiffer, and K. W. West, Solid State Commun. 84, 95 (1992). 10.1016/0038-1098(92)90302-P
34. W. Pan, J. S. Xia, H. L. Stormer, D. C. Tsui, C. L. Vicente, E. D. Adams, N. S. Sullivan, L. N. Pfeiffer, K. W. Baldwin, and K. W. West, Phys. Rev. Lett. 95, 066808 (2005). 10.1103/PhysRevLett.95.066808
35. B. Tieke, R. Fletcher, U. Zeitler, A. K. Geim, M. Henini, and J. C. Maan, Phys. Rev. Lett. 78, 4621 (1997). 10.1103/PhysRevLett.78.4621
36. S. H. Simon and B. I. Halperin, Phys. Rev. Lett. 73, 3278 (1994). 10.1103/PhysRevLett.73.3278
37. S. H. Simon and N. R. Cooper, Phys. Rev. B 56, R7116 (1997). 10.1103/PhysRevB.56.R7116
38. L. Soukiassian, G. Spengler, D. Leprat, F. Schopfer, and W. Poirier, in 2010 CPEM Digest, Daejeon, edited by, Y. S. Song, and, J.-S. Kang, (IEEE Trans. Instrum., 2010), p. 761.