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Nanoscale

Volumn 5, Issue 13, 2013, Pages 5747-5751

High sensitivity piezomagnetic force microscopy for quantitative probing of magnetic materials at the nanoscale

(6) Chen, Qian Nataly a Ma, Feiyue a Xie, Shuhong b Liu, Yuanming a Proksch, Roger c Li, Jiangyu a

a University of Washington (United States)

b XIANGTAN UNIVERSITY (China)

c United States (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT STIFFNESS; EXTERNAL MAGNETIC FIELD; FORCE MICROSCOPY; HIGH SENSITIVITY; IMAGING PRINCIPLE; MAGNETIC NANOSTRUCTURES; RESONANCE TRACKING; SPATIAL RESOLUTION;

ENERGY DISSIPATION; MAGNETIC MATERIALS; NANOTECHNOLOGY;

MAGNETIC THIN FILMS;

ARTICLE; EQUIPMENT; MAGNETIC FIELD; METHODOLOGY; MICROSCOPY; DEVICES; PROCEDURES;

MAGNETIC FIELDS; MICROSCOPY;

EID: 84883227493 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c3nr00770g Document Type: Article

Times cited : (22)

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