SCOPUS 정보 검색 플랫폼

Volumn 4, Issue 2, 2012, Pages 408-413

High resolution quantitative piezoresponse force microscopy of BiFeO 3 nanofibers with dramatically enhanced sensitivity

(7) Xie, Shuhong a,b Gannepalli, Anil c Chen, Qian Nataly b Liu, Yuanming b Zhou, Yichun a Proksch, Roger c Li, Jiangyu b

a XIANGTAN UNIVERSITY (China)

b University of Washington (United States)

c United States (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN-SWITCHING PROCESS; DUAL FREQUENCY; ENHANCED SENSITIVITY; HIGH RESOLUTION; NANOCRYSTALLINES; PIEZOELECTRIC COEFFICIENT; PIEZORESPONSE; PIEZORESPONSE FORCE MICROSCOPY; QUALITY FACTORS;

CRYSTALLOGRAPHY; FERROELECTRICITY; NANOFIBERS; NANOSTRUCTURES; PIEZOELECTRIC DEVICES; PROBES; RESONANCE;

PIEZOELECTRICITY;

BISMUTH; BISMUTH OXIDE; FERRIC ION; FERRIC OXIDE; NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; MATERIALS TESTING; METHODOLOGY; MICROELECTROMECHANICAL SYSTEM; PARTICLE SIZE; SENSITIVITY AND SPECIFICITY; TENSILE STRENGTH; ULTRASTRUCTURE; YOUNG MODULUS;

BISMUTH; ELASTIC MODULUS; FERRIC COMPOUNDS; MATERIALS TESTING; MICRO-ELECTRICAL-MECHANICAL SYSTEMS; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; PARTICLE SIZE; SENSITIVITY AND SPECIFICITY; TENSILE STRENGTH;

EID: 84855606420 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c1nr11099c Document Type: Article

Times cited : (92)

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